Characterization of Nanosystems


Due to scientific development, high-resolution X-ray computed tomography systems can be developed, permitting the internal picturing of material in three dimensions. However, in order to obtain structural information one also needs proper three-dimensional analysis software. A Nano system publishes significant original work ranging from technologies and systems to product invention and fresh built-up processes with features at the nanoscale.




  • Printed electronics and MEMS (micro-electromechanical system)




  • Diluted magnetic semi-conductors




  • X-ray diffraction




  • Ferromagnetism



    Related Conference of Characterization of Nanosystems

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    39th Global Nanotechnology Congress

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    18th Nanotechnology and Nanomedicine Congress

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    25th World Nanotechnology Congress

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    8th Annual Meet on Nanoscience and Nanotechnology

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    33rd World Nano Conference

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    36th International Conference on Nanotechnology & Expo

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    Applied Nanotechnology Summit

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